🧪 Back to Basics: Understanding Bruker NanoIR and the Fundamentals of AFM-IR Technology

1. 1. Integration of Spectroscopy & Atomic Force Microscopy (AFM-IR)
   Bruker’s NanoIR combines Atomic Force Microscopy with photothermal infrared spectroscopy to map chemical composition at the 20–100 nm scale, far beyond the resolution limit of conventional optical IR (micron scale). It overcomes the limitation of traditional AFM, which only provides surface topography and mechanical properties. 20–100 nm, jauh melebihi resolusi IR optik konvensional (µm) dan mengatasi kekurangan AFM murni yang hanya mendeteksi topografi dan gaya.

2. Why Not Just AFM?

• • Conventional AFM cannot determine molecular identity—only surface shape and mechanical properties. identitas molekul—hanya bentuk dan sifat mekanik permukaan.
• • NanoIR introduces chemical contrast, enabling analysis of “what” the material is made of, not just “where” structures are located. kimiawi, memungkinkan analisis “apa” bahan itu, bukan hanya “dimana” strukturnya berada.

3. Why Not Use Traditional IR?

• • Optical IR is limited by diffraction, typically constrained to micrometer resolution. mikrometer, tidak bisa memetakan bahan nano.
• • NanoIR pushes resolution down to the nanoscale, allowing chemical heterogeneity analysis in nanocomposites, thin films, and polymers. heterogenitas kimia dalam nanokomposit, film tipis, polimer, dan sejenisnya.

4. 4. An Update to the Previous Article
   While our previous article (Dynatech) emphasized NanoIR’s potential in flexible electronics and smart textiles, Bruker NanoIR now also enables: NanoIR Bruker kini juga mampu:

• • Quantitative IR analysis with spectral calibration comparable to full IR spectrometers.
• • Localized chemical mapping of ‘–OH’, ‘–CO’, and ‘–NH’ functional groups in thin films and polymers. lokal,
• • Dynamic tip-sample contact analysis, ensuring consistent and measurable IR signal. area kontak tip‑sample secara dinamis untuk memastikan sinyal IR yang konsisten dan terukur,
• • Advanced software modules for correlating spatial and chemical information, beyond topographic imaging alone. spasial & kimia selain murni tampilan topografi.
  
  

Chemical Identification of Nanocontaminants)

AFM-IR Distinguish Between Stacking Orders of Rhombohedral Graphene)

5. 5. Key Benefit of NanoIR

6. Why It Matters

• • For R&D: Accelerates material innovation by uncovering localized chemical structure in π-polymers and composites.
• • For production: More accurate QC — detects micro-defects or contamination non-destructively.
• • The unique combination of AFM + IR → one instrument, two domains: visualization and chemical identification, without compromise.

Bruker’s NanoIR bridges the critical gap between traditional AFM and IR by enabling true chemical analysis at the nanoscale — something neither technique can achieve on its own. It’s not just an upgrade; it’s a new analytical class designed for advanced research in functional materials, nanocomposites, thin films, and cutting-edge QC environments. kimia analisis di skala nano, yang tidak bisa dicapai oleh keduanya secara terpisah. Ini bukan sekadar upgrade — melainkan alat baru yang menjembatani celah penting antara topografi dan komposisi kimia. Cocok untuk riset lanjutan bahan fungsional, nanokomposit, film tipis, maupun aplikasi QC canggih.

Getting to Know the Nanoindenter: A Tool for Understanding Mechanical Properties of Materials at the Nanoscale

Imagine wanting to know how hard or elastic a material is—at a scale thousands of times smaller than a human hair. This is where the nanoindenter comes into play: an advanced instrument that allows us to "press" on a material's surface at the nanoscale to measure hardness, elasticity, and other mechanical characteristics. nanoindenter berperan, sebuah alat canggih yang memungkinkan kita “menekan” permukaan material pada skala nano untuk mengukur kekerasan, elastisitas, dan karakteristik mekanik lainnya.

Why Is a Nanoindenter Needed?

Traditional methods such as tensile testing or Vickers hardness testing are less effective when examining thin films, nanoparticles, or soft biological materials. These conventional methods require large and specifically shaped samples. However, in fields like semiconductors, hard coatings, or even contact lenses, we often deal with ultra-thin materials or microstructures. This is where the nanoindenter becomes the ideal solution. film tipis, partikel nano, atau material biologis lunak. Masalahnya, metode ini butuh sampel besar dan bentuk spesifik. Tapi dalam dunia semikonduktor, pelapis keras, atau bahkan lensa kontak, kita sering berurusan dengan material super-tipis atau struktur mikro. Di sinilah nanoindenter menjadi solusi.

How the Nanoindenter Works

A nanoindenter operates by pressing a sharp tip (typically conical in shape) into a material’s surface while precisely recording the applied force and penetration depth. From the resulting graph, we can calculate two critical parameters: • Hardness: How much force is required to indent the material. • Elastic Modulus: How stiff or flexible the material is. Technologies like those from Bruker Hysitron enable measurements of forces as small as 2 nanoNewtons and indentation depths as shallow as 0.02 nanometers!

• Hardness (Kekerasan): Seberapa besar gaya dibutuhkan untuk menekan material.
• Elastic Modulus (Modulus Elastisitas): Seberapa lentur atau kaku material tersebut.

Teknologi seperti yang ditawarkan oleh Bruker Hysitron bahkan memungkinkan pengukuran gaya sekecil 2 nanoNewton dan kedalaman serendah 0,02 nanometer!

(Displacement curve on fused quartz (an elastic-plastic material), along with in-situ SPM image after quasi-static nanoindentation showing residual indent impression)

Key Features of Bruker Hysitron Nanoindenter

Bruker enhances the capabilities of its nanoindenter with features such as:

1. 1. Nano-scratch

The indenter tip is dragged under load to measure adhesion, scratch resistance, and delamination in thin films.

2. 2. Nano-wear

Visualization of deformation before and after testing with position accuracy of ±10 nm.

3. SPM imaging

Sebagai visualisasi deformasi sebelum dan sesudah pengujian dengan posisi akurasi ± 10 nm.

4. 4. Extreme Temperature Testing

Mechanical testing in a wide temperature range from -150°C to 800°C, including humid or liquid environments (using environmental stages like xSol).

5. 5. Raman Spectroscopy and Electrochemical Testing dan elektrokimia

Coordinated testing of mechanical properties and chemical composition at the same location, or under electrochemical conditions.

3D nanoscratch image of a low-k film, showing evidence of film failure	Nanowear testing on diamond-like carbon (DLC) coating of a computer hard disk drive using different loads and scratch paths	Bruker SPM technology using the same probe for both mechanical testing and topography imaging

Silicon surface at 800°C with SPM image obtained from XPM (Extreme Performance Module) testing	Raman spectrum taken at the silicon indentation site

Nanoindenter Applications

From semiconductors, lithium-ion battery electrodes, specialty metals, to dental composites and contact lenses, nanoindenters are vital tools in both research and industry. The data they generate are not only essential for developing cutting-edge technology, but are also frequently published in leading scientific journals.

Overcoming the Challenges of Complex Surface Profiling with Renishaw’s LiveTrack Technology

Measuring uneven surfaces has always been a challenge in both science and industry. Sloping, wavy, or changing surfaces during analysis can lead to weak signals, blurry images, or even data loss—a common problem in Raman imaging and surface metrology. Now, thanks to Renishaw’s latest innovation, LiveTrack®, this challenge can be overcome.

LiveTrack technology maintains laser focus automatically and in real time during scanning. This means that even if a sample surface varies in height or is uneven, the system continuously adjusts the sample stage height to keep the focus sharp—without manual intervention or complex sample preparation. By combining precision vertical motion control with optical focus monitoring, LiveTrack maintains focus even under varying temperatures, humidity, or when the sample is moving.

(The sample stage moves up and down automatically to maintain focus)

Imagine mapping graphene on a rough substrate, or monitoring a chemical reaction that causes surface deformation. With conventional methods, you would miss most of the crucial data. But with LiveTrack, all those changes can be captured accurately and in full detail. This technology tracks surface changes both spatially (sloped, wavy) and temporally (during reactions or heating processes).

(Graphene surface grown on a copper substrate)

(Active pharmaceutical ingredient (API) distribution detection in a tablet using 3D Raman LiveTrack)

(2D and 3D Raman images showing surface topography variations of a rat mandible)

Another advantage? No more need to polish or flatten the sample before analysis. This not only saves time but also preserves the integrity of delicate samples—such as forensic evidence, biological tissues, or 3D-printed materials. This system is integrated into Renishaw’s inVia Qontor platform, which is equipped with advanced imaging and automated control systems. The result? High-quality chemical mapping, even on the most complex surfaces. inVia Qontor dari Renishaw, dilengkapi dengan sistem imaging dan kontrol otomatis. Hasilnya? Pemetaan kimia berkualitas tinggi pada permukaan paling kompleks sekalipun.

With LiveTrack®, Renishaw offers not just a technology, but a real solution to improve efficiency and accuracy in research and testing. If you work with challenging samples, this technology could be a game-changer in your lab workflow.

Raman Spectroscopy for Forensics: Analysis of GSR, Narcotics, and Fingerprint Traces

Raman spectroscopy has become a go-to tool in forensic analysis due to its ability to rapidly detect chemical compounds with high precision in a non-destructive manner. Here are three key forensic applications:

1. 1. Gunshot Residue (GSR) Analysis

Raman spectroscopy can detect gunshot residue particles as small as 1 micron directly on the surface of an object, without requiring sample transfer. Compounds such as barium oxide (BaO) and barium carbonate (BaCO₃) can be identified using Renishaw's forensic database, enabling fast and accurate GSR analysis.

(Raman spectrum of IGSR collected from a fired cartridge case)

2. Narcotic Tablet Identification

Raman is used to map the composition of narcotic tablets, such as MDMA in ecstasy, using line focus imaging. With the help of EM-MCR (Empty Modelling – Multivariate Curve Resolution) and MATLAB software, thousands of spectra can be analyzed to reveal the detailed distribution of active compounds and excipients.

(Comparison of the spectrum of a component obtained through empty modelling with a reference spectrum of MDMA)

3. Particle Traces in Fingerprints

By combining optical microscopy and Raman, microscopic particles within fingerprints can be analyzed. Oblique illumination aids in visualizing particles on uneven surfaces such as cans, which are then chemically analyzed using Raman to obtain compositional and size information.

(Accurate detection and analysis of material fragments)

Raman spectroscopy offers fast and precise solutions to various forensic investigation challenges—from bullet residues and narcotics to invisible traces in fingerprints.

What is AFM? Let's Get to Know This Nano-Scale Microscope from Bruker!

Ever imagined seeing something 100,000 times smaller than a strand of hair? That’s impossible with an ordinary microscope. But with Atomic Force Microscopy (AFM) from Bruker, we can observe the surface of objects down to the nanoscale (1 nanometer = 1 billionth of a meter).

What is AFM?

AFM is an advanced type of microscopy that works by “feeling” the surface of an object using a super tiny needle (tip) mounted on a cantilever. It works similarly to how a finger touches and follows the texture of a surface — but with atomic-level precision.

(Mekanisme Kerja AFM)

Common AFM Operating Modes:

• • Contact Mode: the tip directly touches the surface.
• • Tapping Mode: the tip gently “taps” the surface periodically.

🔍 Why is AFM important?

AFM allows us to:

• • Visualize nanoscale surface structures such as living cells, hair fibers, and thin films on electronic chips.
• • Produce ultra-detailed 3D images of surfaces without needing staining or a vacuum environment.
• • Observe samples even in liquid media — very useful for biological samples.

Ultra-detailed 3D image of native collagen fibril showing 67 nm banding pattern	Thickness of DNA origami lattice in liquid sample

What is AFM Used For?

Bruker’s AFM is used in various fields, such as:

• • Observing living cells, bacteria, and other biological samples in life science research.
• • Detecting microcracks or defects in electronic chips.
• • Analyzing the texture and roughness of cosmetic or pharmaceutical materials.
• • Assessing metal and polymer surfaces in material industries.

DNA observation at -25°C	Real-time monitoring of cracking and detachment in SEI layers

Surface roughness measurement of silicon wafers

AFM images of various materials showing surface textures (cracks, roughness, and crystalline patterns)

AFM dari Bruker adalah teknologi mutakhir yang membuka akses menuju dunia mikroskopis nan presisi, memungkinkan para peneliti, insinyur, dan industri untuk menjelajahi permukaan material dengan akurasi luar biasa.

Bruker's AFM is a cutting-edge technology that opens access to the microscopic world with high precision, enabling researchers, engineers, and industries to explore material surfaces with exceptional accuracy.

FusionScope: A New Revolution in High-Precision Microscopy

combining Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) into one system. This innovation addresses the challenge of analyzing complex samples, such as razor blades, by using SEM to guide the placement of the AFM tip in real-time, ensuring accuracy down to the nanometer level. The technology uses piezoresistive strain sensors to read the deflection of the AFM cantilever without lasers, allowing simultaneous SEM imaging without interference.

(SEM image of cantilever tip above the razor blade showing tip geometry and topography)

(The FusionScope works by measuring the cantilever's bending due to interactions between the tip and sample using piezoresistive strain sensors)

In its application, such as studying razor blade surfaces, FusionScope enables :

• using optical camera
• • Fine positioning using SEM live imaging,
• • 3D topographic scanning of the surface with nanometer resolution,
• • Blade tip radius analysis with accuracy down to 60–80 nm.

(3D topography of the razor blade surface with 5 μm x 24 μm size and nanometer resolution)

Users can quickly scan sample points and analyze material variations or structural sharpness within a single system, such as the "double-groove" feature found on the razor blade surface.

(AFM topography image showing a 'double-groove' feature on the razor blade)

(Line scans at two positions on the razor blade for analyzing the blade radius with nanometer resolution)

With FusionScope, the complexity of measurements in the nano world becomes simpler, more accurate, and faster — making it an indispensable tool for scientists, engineers, and researchers in various fields, from materials to biology and advanced technologies.

Bruker ContourX-100: Innovative Optical Profilometer for High-Precision Surface Analysis

The Bruker ContourX-100 is a state-of-the-art optical profilometer designed for fast, accurate, and non-destructive 3D surface analysis. Using white light interferometry (WLI) technology, this system enables high-resolution topography measurements from the nanometer to millimeter scale—without making physical contact with the sample surface.

Its compact design and intuitive user interface make the ContourX-100 highly suitable for a variety of applications, including scientific research, materials development, and quality control across industries such as manufacturing, electronics, automotive, and biomedicine.

Key Advantages:

• • Sub-nanometer vertical resolution for ultra-precise surface measurements
• • Non-contact measurement that preserves sample integrity
• • Automated scanning to increase workflow efficiency
• • Wide material and surface compatibility
• • Integrated software for streamlined data processing and reporting

Application Areas :

• • MetrologyEnsure surface texture and dimensional accuracy in precision parts; ideal for GD&T conformance.
• Measure film thickness, step height, and roughness; support metrology throughout MEMS fabrication.
• Analyze implant and lens surfaces for R&D, QA, and QC in medical device production.
• • TribologyEvaluate friction, wear, and lubrication on diverse surfaces to predict performance and lifespan.
• • SemiconductorsPerform non-contact wafer inspections, post-CMP (Chemical Mechanical Planarization) analysis, and defect detection.

• OpticsAssess and optimize polishing of lenses, aspheres, and micro-optical structures with sub-nm precision.

(Metrologi)

(MEMS & Sensor)

Orthopedics/Ophthalmics)

(Tribologi)

Semiconductors)

Optics)

The Bruker ContourX-100 stands out as a smart solution for precise and reliable surface characterization. It significantly enhances productivity in both laboratory and production environments, and supports data-driven decision-making in material development and quality assurance.

Dimension Nexus: Next-Generation Atomic Force Microscopy for Various Applications

Bruker's Dimension Nexus is the latest breakthrough in Atomic Force Microscopy (AFM), combining high performance, experimental flexibility, and ease of use in a compact system. Equipped with the NanoScope® 6 Controller and PeakForce Tapping® technology, this instrument delivers high-resolution imaging and precise metrology capabilities for a wide range of research and industrial applications.

Key Advantages of Dimension Nexus:

• Experimental Flexibility – Supports over 50 AFM modes, allowing customization for diverse research needs.
• 2. High Resolution – Capable of atomic and sub-molecular level imaging, ideal for advanced material characterization.
• High Productivity – Features a programmable motorized stage, accelerating data collection and enhancing experimental efficiency.

Various Applications of Dimension Nexus:

1. 1. Polymer and Composite Characterization
   • • With PeakForce QNM®, this system can map nanomechanical distribution in polymer blends such as PS-PMMA-PVC, aiding in material property analysis.
2. 2. 2D Material Research
   • • Nexus enables the characterization of graphene, moiré superlattices, and hexagonal boron nitride (hBN) using Kelvin Probe Force Microscopy (KPFM) for surface potential studies.
     

     

     (Citra Hexagonal boron nitride (hBN) imaged with Kelvin Probe Force Microscopy (KPFM). The topography image (left) and surface potential map (right) are 6×6 µm, acquired using an SCM-PIT-V2 probe. menggunakan Kelvin Probe Force Microscopy (KPFM). Gambar topografi (kiri) dan peta potensi permukaan (kanan) berukuran 6×6 µm, diperoleh dengan probe SCM-PIT-V2.)

3.  3. Lithium-Ion Battery Analysis 
   
   • • Enables in-situ electrochemical studies to observe local activity and electrode degradation at the nanoscale.
   •  
4. 4. Semiconductor Metrology
   • • Used for high-precision surface roughness measurements of thin films, supporting the electronics manufacturing industry.

     

     (DataCube CR PFM pada film tipis piezoelektrik BFO. Grafik menunjukkan amplitudo PFM terhadap tegangan pada berbagai frekuensi di 5 titik sampel. Citra amplitudo PFM 3 µm (inset), menggunakan probe SCM-PIT-V2.)

5. 4. Semiconductor Metrology
   • • With ScanAsyst® and PeakForce Tapping, the system can observe triangular DNA origami structures in fluid without damaging the sample, opening new possibilities in nanobiotechnology.
     
     ScanAsyst image of triangular DNA origami in fluid. Scan size: 500×500 nm, acquired using a ScanAsyst-Fluid+ probe
     

With its advanced features and broad application range, Dimension Nexus is the premier choice for research laboratories, industries, and multi-user facilities that require cutting-edge AFM technology with optimal value.

Dimension Nexus AFM