Dimension Nexus : Atomic Force Microscopy Generasi Baru untuk Berbagai Aplikasi

Dimension Nexus: Next-Generation Atomic Force Microscopy for Various Applications

Bruker's Dimension Nexus is the latest breakthrough in Atomic Force Microscopy (AFM), combining high performance, experimental flexibility, and ease of use in a compact system. Equipped with the NanoScope® 6 Controller and PeakForce Tapping® technology, this instrument delivers high-resolution imaging and precise metrology capabilities for a wide range of research and industrial applications.

Key Advantages of Dimension Nexus:

• Experimental Flexibility – Supports over 50 AFM modes, allowing customization for diverse research needs.
• 2. High Resolution – Capable of atomic and sub-molecular level imaging, ideal for advanced material characterization.
• High Productivity – Features a programmable motorized stage, accelerating data collection and enhancing experimental efficiency.

Various Applications of Dimension Nexus:

1. 1. Polymer and Composite Characterization
   • • With PeakForce QNM®, this system can map nanomechanical distribution in polymer blends such as PS-PMMA-PVC, aiding in material property analysis.
2. 2. 2D Material Research
   • • Nexus enables the characterization of graphene, moiré superlattices, and hexagonal boron nitride (hBN) using Kelvin Probe Force Microscopy (KPFM) for surface potential studies.
     

     

     (Citra Hexagonal boron nitride (hBN) imaged with Kelvin Probe Force Microscopy (KPFM). The topography image (left) and surface potential map (right) are 6×6 µm, acquired using an SCM-PIT-V2 probe. menggunakan Kelvin Probe Force Microscopy (KPFM). Gambar topografi (kiri) dan peta potensi permukaan (kanan) berukuran 6×6 µm, diperoleh dengan probe SCM-PIT-V2.)

3.  3. Lithium-Ion Battery Analysis 
   
   • • Enables in-situ electrochemical studies to observe local activity and electrode degradation at the nanoscale.
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4. 4. Semiconductor Metrology
   • • Used for high-precision surface roughness measurements of thin films, supporting the electronics manufacturing industry.

     

     (DataCube CR PFM pada film tipis piezoelektrik BFO. Grafik menunjukkan amplitudo PFM terhadap tegangan pada berbagai frekuensi di 5 titik sampel. Citra amplitudo PFM 3 µm (inset), menggunakan probe SCM-PIT-V2.)

5. 4. Semiconductor Metrology
   • • With ScanAsyst® and PeakForce Tapping, the system can observe triangular DNA origami structures in fluid without damaging the sample, opening new possibilities in nanobiotechnology.
     
     ScanAsyst image of triangular DNA origami in fluid. Scan size: 500×500 nm, acquired using a ScanAsyst-Fluid+ probe
     

With its advanced features and broad application range, Dimension Nexus is the premier choice for research laboratories, industries, and multi-user facilities that require cutting-edge AFM technology with optimal value.

Dimension Nexus AFM