{"id":8480,"date":"2024-03-07T11:57:37","date_gmt":"2024-03-07T04:57:37","guid":{"rendered":"https:\/\/dynatech-int.com\/?post_type=product&#038;p=8480"},"modified":"2024-03-07T16:56:22","modified_gmt":"2024-03-07T09:56:22","slug":"nexsa-g2-xps","status":"publish","type":"product","link":"https:\/\/dynatech-int.com\/id\/product\/by-product\/electron-microscope\/xps-instruments\/nexsa-g2-xps\/","title":{"rendered":"Nexsa G2 XPS"},"content":{"rendered":"<p>The Thermo Scientific Nexsa G2 X-Ray Photoelectron Spectrometer (XPS) System offers fully automated, high-throughput surface analysis, delivering the data to advance research and development or to solve production problems. The integration of XPS with ion scattering spectroscopy (ISS), UV photoelectron spectroscopy (UPS), reflected electron energy loss spectroscopy (REELS), and Raman spectroscopy, allows you to conduct true correlative analysis. The system now includes options for sample heating and sample biasing capabilities to increase the range of experiments now possible. The Nexsa G2 Surface Analysis System unlocks the potential for advances in materials science, microelectronics, nanotechnology development, and many other applications.<\/p>\n<h4>Key Features<\/h4>\n<p>&#8211; High-performance X-ray source<br \/>\n&#8211; Sample viewing<br \/>\n&#8211; Depth profiling<br \/>\n&#8211; Digital Control<br \/>\n&#8211; Optimized electron optics<br \/>\n&#8211; Insulator analysis<br \/>\n&#8211; Optional sample holders<br \/>\n&#8211; NX sample heater module<\/p>\n<p>For more info click here (<a class=\"waffle-rich-text-link\" href=\"https:\/\/www.thermofisher.com\/id\/en\/home\/electron-microscopy\/products\/xps-instruments\/nexsa.html\">https:\/\/www.thermofisher.com\/id\/en\/home\/electron-microscopy\/products\/xps-instruments\/nexsa.html<\/a>)<\/p>\n","protected":false},"excerpt":{"rendered":"<p>The Thermo Scientific Nexsa G2 X-Ray Photoelectron Spectrometer (XPS) System offers fully automated, high-throughput surface analysis, delivering the data to advance research and development or to solve production problems. The integration of XPS with ion scattering spectroscopy (ISS), UV photoelectron spectroscopy (UPS), reflected electron energy loss spectroscopy (REELS), and Raman spectroscopy, allows you to conduct [&hellip;]<\/p>\n","protected":false},"featured_media":8481,"template":"","meta":[],"product_cat":[135,145,292,210,297],"product_tag":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v21.8 (Yoast SEO v21.8) - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Nexsa G2 XPS - PT Dynatech International<\/title>\n<meta name=\"description\" content=\"Informasi mengenai Nexsa G2 XPS dari PT Dynatech International . 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