{"id":3170,"date":"2020-04-06T07:24:45","date_gmt":"2020-04-06T07:24:45","guid":{"rendered":"https:\/\/dynatech-int.com\/?product=dimension-icon"},"modified":"2022-03-31T09:31:39","modified_gmt":"2022-03-31T02:31:39","slug":"dimension-icon","status":"publish","type":"product","link":"https:\/\/dynatech-int.com\/id\/product\/by-market\/material-science-1\/dimension-icon\/","title":{"rendered":"Dimension Icon"},"content":{"rendered":"<p>Bruker\u2019s Dimension Icon <a href=\"https:\/\/dynatech-int.com\/id\/product-categories\/atomic-force-microscope\/\">Atomic Force Microscope (AFM)<\/a> adalah suatu sistem yang dirancang menggunakan large-sample AFM platform memberikan performa, fungsionalitas dan aksebilitas terbaik pada penelitian skala nano bidang science maupun industry.<\/p>\n<p>Dimension Icons didesign sedemikian rupa untuk memberikan hasil citra terbaik dengan low drift dan low noise hanya dalam hitungan menit. Dilengkapi dengan sistem ScanAsyst automatic image optimization sehingga dapat digunakan dengan mudah, cepat, dan konsisten.<\/p>\n<p><strong>Ultimate Performance<\/strong><\/p>\n<ul>\n<li>Desain sensor pada close-loop dengan open-loop noise levels pada large-sample tip-scanning AFM<\/li>\n<li>Mengurangi\u00a0<em>noise floor<\/em>\u00a0sehingga menghasilkan citra pada tingkat atomik menggunakan mode kontak dan kurang dari 30 pm dengan TappingMode<sup>TM<\/sup><\/li>\n<li>Memiliki system drift rates 200 pm per menit, menghasilkan distortion-free images<\/li>\n<li>Integrated feedback alignment yang untuk penentuan posisi probe presisi dan cepat.<\/li>\n<li>Kamera dengan resolusi tinggi dan posisi X-Y yang cepat,navigasi sampel lebih efisien.<\/li>\n<li>ScanAsyst terbaru dan software NanoScope\u00ae untuk kinerja yang optimal.<\/li>\n<\/ul>\n<p><strong>Superior Versatility<\/strong><\/p>\n<ul>\n<li>Wide- open access pada tip dan sample dapat dimanfaatkan untuk berbagai eksperimen baik standar maupun khusus.<\/li>\n<li>Custom user-programmable scripts menawarkan pengukuran dan analisis semi-automated.<\/li>\n<\/ul>\n<p>Dimension Icon memiliki resolusi terbaik, dilengkapi dengan system Bruker\u2019s electronic scanning algorithms memberikan gambar kualitas terbaik dan cepat. Dengan menggabungkan temperature- compensating position sensors menghasilkan noise level pada skala sub-Angstrom di sumbu Z, dan skala Angstrom di sumbu XY. Dengan Sistem scan range 90 mikron,melampaui open loop noise level pada AFMs.<\/p>\n<p>Dimension Icon menghasilkan\u00a0<em>lower noise floor<\/em>\u00a0dan akurasi yang lebih tinggi jika dibandingkan dengan Large-sample AFMs yang ada saat ini.<\/p>\n<p><strong>Exceptional Productivity<\/strong><\/p>\n<p>Dimension AFMs sudah digunakan di banyak publikasi dan memberikan hasil yang memuaskan dalam penelitian maupun industri. Software yang intuitif membuat kinerja AFM lebih mudah dan sederhana. Hasil citra dengan kualitas tinggi dapat diperoleh hanya dalam hitungan menit.<\/p>\n<p><strong>World\u2019s Most Flexible Platform<\/strong><\/p>\n<p>Platform Dimension telah berevolusi untuk memenuhi target pasar yang terus berkembang. Icon dengan aksesoris pendukung dan mode AFMs yang digunakan dirancang untuk AFMs masa depan.<\/p>\n<p><strong>Powerful AFM Control<\/strong><\/p>\n<p>Dimension Icon mampu menampilkan sampai 8 gambar secara bersamaaan dengan menggunakan nanoscope Controller V. Rasio sinyal terhadap Noise lebih unggul dibandingkan dengan AFMs lainya. Pengambilan data dengan kecepatan tinggi dengan hasil gambar resolusi tinggi (5120 x 5120) sehingga peneliti dapat merekam dan menganalisis interaksi tip-sample hingga skala nano pada rentang waktu yang sebelumnya tidak dapat diakses oleh AFMs.<\/p>\n<figure id=\"attachment_5865\" aria-describedby=\"caption-attachment-5865\" style=\"width: 300px\" class=\"wp-caption aligncenter\"><img decoding=\"async\" class=\"wp-image-5865 size-medium\" src=\"https:\/\/dynatech-int.com\/wp-content\/uploads\/2020\/04\/intuitive-graphical-user-300x149.png\" alt=\"intuitive graphical user dimension icon\" width=\"300\" height=\"149\" srcset=\"https:\/\/dynatech-int.com\/wp-content\/uploads\/2020\/04\/intuitive-graphical-user-300x149.png 300w, https:\/\/dynatech-int.com\/wp-content\/uploads\/2020\/04\/intuitive-graphical-user-18x9.png 18w, https:\/\/dynatech-int.com\/wp-content\/uploads\/2020\/04\/intuitive-graphical-user.png 391w\" sizes=\"(max-width: 300px) 100vw, 300px\" \/><figcaption id=\"caption-attachment-5865\" class=\"wp-caption-text\">The intuitive graphical user interface provides immediate access to eight channels and extensive controller functions.<\/figcaption><\/figure>\n<p>&nbsp;<\/p>\n<p>Image data (left) show topography of triblock copolymer with 5Kx5K data points, 10\u00b5m scan size in closed-loop. Zoomed image (right) is a 500nm section of the larger scanned image.<\/p>\n<p><strong>Material Mapping:<\/strong><\/p>\n<p>Dimension Icon telah dilengkapi dengan Bruker\u2019s Patent-pending PeakForce QNM<sup>\u00ae<\/sup>\u00a0imaging mode. Fitur ini mampu memetakan dan membedakan secara kuantitatif setiap sifat nanomekanik dan secara bersamaan juga diperoleh topografi citra sampel dengan resolusi tinggi. Teknologi ini beroperasi pada range (1 MPa sampai 50 GPA terhadap modulus dan 10 pN sampai 10un terhadap adhesi) untuk karakteristik sampel.<\/p>\n<p><img decoding=\"async\" class=\"size-medium wp-image-5864 aligncenter\" src=\"https:\/\/dynatech-int.com\/wp-content\/uploads\/2020\/04\/data-histogram-300x102.png\" alt=\"Data histogram \" width=\"300\" height=\"102\" srcset=\"https:\/\/dynatech-int.com\/wp-content\/uploads\/2020\/04\/data-histogram-300x102.png 300w, https:\/\/dynatech-int.com\/wp-content\/uploads\/2020\/04\/data-histogram-18x6.png 18w, https:\/\/dynatech-int.com\/wp-content\/uploads\/2020\/04\/data-histogram.png 475w\" sizes=\"(max-width: 300px) 100vw, 300px\" \/><\/p>\n<p><strong>Electrical Characterization :<\/strong><\/p>\n<p>Dimension Icon mampu menampilkan karakteristik elektrik sampai skala nano. Menggunakan proprietary mode untuk meningkatkan sensitifitas dan dynamic range. Dengan kombinasi pada Dark Lift pada hasil artefact-free pada scanning capacitance microscope, scanning spreading resistance, tunnelling AFM atau torsional resonance Tunneling AFM.<\/p>\n<p><strong>Nanomanupulation :<\/strong><\/p>\n<p>Dimension Icon mampu melakukan manipulasi dan litrografi pada skala nanometer hingga skala molekul. XYZ closed-loop scanner menghasilkan posisi probe yang akurat tanpa piezo-creep dan low noise. Posisi tersebut sangat memungkitkan pada system nanomanipulation.<\/p>\n<p><strong>Heating dan Cooling:<\/strong><\/p>\n<p>Mampu menyajikan temperature kontrol dan analisis termal pada sampel dari -35\u00b0C sampai 250\u00b0C dan disaat bersamaan melakukan scanning dengan berbagai mode AFM. Jika menggunakan thermal probe mampu hingga 400\u00b0C pada sub-100 nm.<\/p>\n<p><img decoding=\"async\" class=\"size-full wp-image-5866 aligncenter\" src=\"https:\/\/dynatech-int.com\/wp-content\/uploads\/2020\/04\/heating-and-cooling.png\" alt=\"heating and cooling dimension icon\" width=\"284\" height=\"143\" srcset=\"https:\/\/dynatech-int.com\/wp-content\/uploads\/2020\/04\/heating-and-cooling.png 284w, https:\/\/dynatech-int.com\/wp-content\/uploads\/2020\/04\/heating-and-cooling-18x9.png 18w\" sizes=\"(max-width: 284px) 100vw, 284px\" \/><\/p>\n<p>More information:<\/p>\n<p><a href=\"https:\/\/www.bruker.com\/en\/products-and-solutions\/microscopes\/materials-afm\/dimension-icon-afm.html\">bruker.com<\/a><\/p>\n<p><a href=\"https:\/\/www.bruker.com\/en\/products-and-solutions\/microscopes\/materials-afm.html\">bruker.com<\/a><\/p>\n<p>&nbsp;<\/p>\n<p><strong>Ultimate Performance<\/strong><\/p>\n<ul>\n<li>The Sensor design achieves closed-loop performance with open-loop noise levels on a large-sample tip-scanning AFM<\/li>\n<li>Reduced noise floor allows imaging at the atomic level in contact mode, with less than 30 pm in TappingMode\u2122<\/li>\n<li>The system has drift rates less than 200 pm per minute, renders distortion-free images.<\/li>\n<li>Integrated feedback alignment tools allow rapid and precise probe positioning<\/li>\n<li>High-resolution camera and X-Y positioning enables more rapid, more efficient sample navigation<\/li>\n<li>ScanAsyst Imaging and NanoScope\u00ae software for optimal performance<\/li>\n<\/ul>\n<p><strong>Superior Versatility<\/strong><\/p>\n<ul>\n<li>Allows standard and customized experiment due to the Wide-open access to tip and sample<\/li>\n<li>Custom user-programmable scripts offer semi-automated measurement and analysis<\/li>\n<\/ul>\n<p>The Dimension Icon has a superior resolution, using Bruker\u2019s electronic scanning algorithms, allowing the user to obtain fast, and improved quality images. It incorporates temperature \u2013 compensating position sensors to render noise level on sub-Angstrom range for the Z-axis, and on Angstrom on the XY axis. This is a high-level performance in a large\u00a0 sample, 90-micron scan range system surpasses the open-loop noise level of AFMs.<\/p>\n<p>The Icon has a lower noise floor and higher accuracy than any large-sample AFM on the market today.<\/p>\n<p><strong>Exceptional Productivity<\/strong><\/p>\n<p>The Dimension family of AFMs has enabled more published data than any other large-sample AFM platform, gaining an astute reputation in both research and industry. The software\u2019s intuitive workflow makes the performance of the AFM technique much simpler and easier. The images obtained are high-quality results without the normal hours of tweaking required.<\/p>\n<p>It has Less than 200pm per minute of drift rate over hours, an all-new intuitive user interface, combine to provide superior productivity, ensuring you faster time to results and publication.<\/p>\n<p><strong>World\u2019s Most Flexible Platform<\/strong><\/p>\n<p>The Dimension platform has evolved to meet the market&#8217;s growing research needs. The icon is powered by the full suite of AFM accessories and modes and is designed for Bruker\u2019s future AFM expansion.<\/p>\n<p><strong>Powerful AFM Control<\/strong><\/p>\n<p>Dimension Icon is able to display and capture up to 8 images simultaneously using the Nanoscope Controller V.\u00a0 The signal to noise ratio is superior to any other large sample tip scanning AFM. It delivers high-speed data capture and high-pixel-density images (5120 x 5120) in eight channels simultaneously, allowing researchers to record and analyze tip-sample interactions that probe nanoscale events at timescales previously inaccessible to AFM.<\/p>\n<figure id=\"attachment_5865\" aria-describedby=\"caption-attachment-5865\" style=\"width: 300px\" class=\"wp-caption aligncenter\"><img decoding=\"async\" class=\"wp-image-5865 size-medium\" src=\"https:\/\/dynatech-int.com\/wp-content\/uploads\/2020\/04\/intuitive-graphical-user-300x149.png\" alt=\"intuitive graphical user dimension icon\" width=\"300\" height=\"149\" srcset=\"https:\/\/dynatech-int.com\/wp-content\/uploads\/2020\/04\/intuitive-graphical-user-300x149.png 300w, https:\/\/dynatech-int.com\/wp-content\/uploads\/2020\/04\/intuitive-graphical-user-18x9.png 18w, https:\/\/dynatech-int.com\/wp-content\/uploads\/2020\/04\/intuitive-graphical-user.png 391w\" sizes=\"(max-width: 300px) 100vw, 300px\" \/><figcaption id=\"caption-attachment-5865\" class=\"wp-caption-text\">The intuitive graphical user interface provides immediate access to eight channels and extensive controller functions.<\/figcaption><\/figure>\n<p>&nbsp;<\/p>\n<p>Image data (left) show the topography of the triblock copolymer with 5Kx5K data points, 10\u00b5m scan size in closed-loop. Zoomed image (right) is a 500nm section of the larger scanned image.<\/p>\n<p><strong>Material Mapping:<\/strong><\/p>\n<p>&nbsp;<\/p>\n<p>Icon supports Bruker\u2019s patent-pending PeakForce QNM\u00ae Imaging Mode, this feature allows the researchers to map and distinguish quantitatively between each nanomechanical properties while simultaneously imaging sample topography on high resolution. This technology operates on 1 MPa to 50 GPA for modulus and 10pN to 10\u03bcn for adhesion to characterize a sample.<\/p>\n<p><img loading=\"lazy\" decoding=\"async\" class=\"alignnone size-medium wp-image-5864\" src=\"https:\/\/dynatech-int.com\/wp-content\/uploads\/2020\/04\/data-histogram-300x102.png\" alt=\"Data histogram \" width=\"300\" height=\"102\" srcset=\"https:\/\/dynatech-int.com\/wp-content\/uploads\/2020\/04\/data-histogram-300x102.png 300w, https:\/\/dynatech-int.com\/wp-content\/uploads\/2020\/04\/data-histogram-18x6.png 18w, https:\/\/dynatech-int.com\/wp-content\/uploads\/2020\/04\/data-histogram.png 475w\" sizes=\"(max-width: 300px) 100vw, 300px\" \/><\/p>\n<p><strong>Electrical Characterization:<\/strong><\/p>\n<p>The dimension icon is able to perform electrical characterization at the nanoscale. It has greater sensitivity and dynamic range using proprietary modes. Combine these methods with Dark Lift, for artifact-free results in scanning capacitance microscopy, scanning spreading resistance, tunneling AFM or torsional resonance tunneling AFM.<\/p>\n<p><strong>Nanomanipulation:<\/strong><\/p>\n<p>Dimension icon Perform manipulation and lithography at the nanometer and molecular scales. The XYZ closed-loop scanner allows accurate probe positioning with no piezo-creep and extremely low noise. It has the best positioning of any available nanomanipulation system.<\/p>\n<p><strong>Heating and Cooling:<\/strong><\/p>\n<p>Able to perform temperature control and thermal analysis on samples from \u201335\u00b0C to 250\u00b0C while simultaneously scanning in numerous AFM modes. It is also able to perform sub-100nm local heating to 400\u00b0C using a thermal probe.<\/p>\n<p>&nbsp;<\/p>\n<p>More information:<\/p>\n<p><a href=\"https:\/\/www.bruker.com\/en\/products-and-solutions\/microscopes\/materials-afm\/dimension-icon-afm.html\">bruker.com<\/a><\/p>\n<p><a href=\"https:\/\/www.bruker.com\/en\/products-and-solutions\/microscopes\/materials-afm.html\">bruker.com<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Bruker\u2019s Dimension Icon Atomic Force Microscope (AFM) adalah suatu sistem yang dirancang menggunakan large-sample AFM platform memberikan performa, fungsionalitas dan aksebilitas terbaik pada penelitian skala nano bidang science maupun industry. Dimension Icons didesign sedemikian rupa untuk memberikan hasil citra terbaik dengan low drift dan low noise hanya dalam hitungan menit. Dilengkapi dengan sistem ScanAsyst automatic [&hellip;]<\/p>\n","protected":false},"featured_media":3171,"template":"","meta":[],"product_cat":[186,227,52],"product_tag":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v21.8 (Yoast SEO v21.8) - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Dimension Icon - PT Dynatech International<\/title>\n<meta name=\"description\" content=\"Informasi mengenai Dimension Icon dari PT Dynatech International . 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