Dimension FastScan

Product Description

Dimension FastScan Atomic Force Microscope (AFM) merupakan perintis AFMs yang memfasilitasi pengguna mendapatkan hasil image sangat cepat tanpa mempengaruhi kualitas resolusi dan kinerja alat. Inovasi ini menjadi patner para peneliti untuk mendapatkan data secara cepat dan efektif untuk semua tingkatan aplikasi AFM.

bruker broadband
Bruker BroadbandTM  Air and Fluid Cantilevers

 

 

Scanner resonant
Scanner Resonant Frequency X-Y: 2.70kHz, Z: >50kHz

 

Sistem Dimension FastScan mampu menghasilkan gambar dengan resolusi tinggi  pengguna dapat melakukan scan pada >125 Mhz atau pada waktu 1 detik tiap gambar.

High Productivity

  • Fast Scanning bekerja 100 kali lebih cepat, dilengkapi dengan automated laser dan detector alignment, memberikan alur kerja yang komprehensif dan dan smart engaging.
  • Dilengkapi dengan software automation ScanAsystTM menyajikan pengukuran yang luar biasa dan berulang.

Resolusi Tinggi

  • FastScan dilengkapi dengan force control yang akurat pada tip sehingga menghasilkan resolusi yang tinggi dan long tip-life
  • TappingMode™ Imaging dapat diperoleh pada 20 Hz dan superb-quality ScanAsyst pada 60 Hz
  • Temperature compensated sensors pada scanners menghantarkan sub-nanometer noise levels.

High Performance on Any AFM Sample

  • Closed-loop Icon and FastScan scanners memberikan vertical noise dibawah skala 30 pm dan 40 pm dan ultra-low drift dengan akurasi tinggi.
  • Tinggi FastScan sampel berkisar dari subnanometer sampai 100 nanometer dengan resolusi tinggi.

Benchmark pada kecepatan AFM

Dimension FastScan adalah AFM pertama yang mampu memperoleh scan-speed, resolution, akurasi, drift,dan noise secara seimbang.

  • Menggunakan lowest drift tip-scanning AFM platform technology dan meningkatkan fundamental resonansi frekuensi.
  • Mengimplementasi generasi terbaru NanoScope® controller dengan high-bandwidth electronics
  • Menggunakan kantilever kecil, memiliki resonasi frekuensi 1,3 MHz di udara, dan 250 kHz sampai 500 kHz pada cairan.

FastScan memberikan Produktivitas terbaik untuk semua jenis Sampel.

  • High bandwidth memungkinkan kontrol dan high scan rates pada closed-lopp accuracy yang melampaui jenis AFM lainnya.
  • TappingMode Scan rates berada pada 20 Hz sehingga memberikan hasil citra sebanding dengan 1 Hz, serta mampu mempertahankan kualitasnya bahkan pada scan rate >100 Hz.
  • ScanAsyst memberikan hasil gambar terbaik pada 6 Hz dan surveying capability mencapai scan rate 32 Hz
  • Kecepatan tip pada sumbu Z adalah  12mm/detik dengan mode kontak, dan kecepatan tip 2,5 mm/detik dalam closed-loop dengan error 1% X-Y. Fitur ini membawa Dimension FastScan menjadi AFM paling praktis seluruh dunia.
  • Automated laser dan detector Alignment memberikan pengaturan yang lebih cepat dan optimal.
  • Sample Navigation membantu mengidentifikasi dan capture sampel dalam skala noanometer dalam hitungan menit.
  • Desain Optical bisa menggunakan semua Bruker broadband small cantilevers sama seperti yang centilevers model lama.
  • Desain tip scanning 210 mm sample stage menghilangkan constraints pada sampel juga dengan lowest noise dan drift.

 

8 minutes with dimension fastscan
8 minutes with Dimension FastScan AFM.

 

60 minutes with dimension fastscan
60 Minutes with Dimension FastScan AFM, 12 Samples,  60 Sites. Automated. Amorphous Drug Formulations. Samples courtesy of M.E. Lauer, O. Grassmann,  F. Hoffmann-La Roche, Basel, Switzerland.

 

Material Mapping

Dimension FastScan telah dilengkapi dengan Bruker’s Patent-pending PeakForce QNM® imaging mode. Fitur ini mampu memetakan dan membedakan secara kuantitatif setiap sifat nanomekanik dan secara bersamaan juga diperoleh topografi citra sampel dengan resolusi tinggi.

Electrical Characterization:

Dimension FastScan mampu menampilkan karakteristik elektrik sampai skala nano. Mengunakan proprietary mode untuk meningkatkan sensitifitas, resolusi dan dynamic range.

PeakForce TUNA™ dan PeakForce SSRM memberikan kemampuan karakteristik elektrik sekaligus memberikan informasi penting terkait sifat mekanis pada lokasi sampel yang sama.

Nanomanupulation :

Dimension FastScan  mampu melakukan manipulasi dan litrografi pada skala nanometer hingga skala molekul. XYZ closed-loop scanner menghasilkan posisi probe yang akurat tanpa piezo-creep dan low noise. Posisi tersebut sangat memungkitkan pada system nanomanipulation.

Heating dan Cooling:

Mampu menyajikan temperature kontrol dan analisis termal pada sampel dari -35°C sampai 250°C dan disaat bersamaan melakukan scanning dengan berbagai mode AFM. Jika menggunakan thermal probe mampu hingga 400°C pada sub-100 nm.

 

More Information:

bruker.com

bruker.com

Bruker BroadbandTM  Air and Fluid Cantilevers

High Productivity

  • The fast scanning work 100s of times faster, with the rates up to frames per second in air or fluid, equipped with automated laser and detector alignment, comprehensive workflow and smart engaging
  • Built-in measurement automation software with ScanAsyst™ provide extraordinary measurement confidence and repeatability

High Resolution

  • FastScan provides accurate force control at the tip allowing the system to obtain high resolution and long tip-life
  • TappingMode™ images can be obtained at 20Hz and superb-quality ScanAsyst images at 6Hz
  • The temperature compensated sensors in the scanners deliver sub-nanometer noise levels, very low noise indeed

High Performance on Any AFM Sample

  • The Closed-loop Icon and FastScan scanners provide vertical noise below 30pm and 40pm and also high accuracy with ultra-low drift
  • Fast scan samples height is ranging from subnanometer to 100s of nanometers  without loss of resolution

The Benchmark for AFM Speed

Dimension FastScan is the first AFM to achieve the perfect equilibrium  of  scan-speed, resolution, accuracy, drift, and noise

  • Used the lowest drift tip-scanning AFM platform technology and increased its fundamental resonant frequency,
  • Implemented a new generation NanoScope® controller with high-bandwidth electronics
  • Using a process for a consistent supply of small cantilevers.  It has 1.3MHz resonant frequency for air and 250kHz to 500kHz for fluid applications,
  • Integrated the mechanical and electronic key elements with a low-noise, high-resonant frequency X-Y-Z scanner.

FastScan Enables the Greatest Productivity Seen on Any AFM

  • High bandwidth allowing control and high scan rates with closed-loop accuracy to surpass the efficiency of any other commercial AFM system
  • 20Hz TappingMode scan rates provide excellent quality images, comparable to that typically seen at 1Hz and maintaining good quality even at scan rates >100Hz
  • ScanAsyst delivers excellent quality images at 6Hz and a surveying capability up to a 32Hz scan rate
  • Z-axis tip velocity of 12mm/second in contact mode and velocities of 2.5mm/second in closed-loop while retaining 1% X-Y tracking error. This feature brings Dimension Fast scan to be the most practical AFM throughout.
  • Automated laser and detector alignment allows quick and optimized setup
  • Using the sample navigation this system able to quickly identify and capture nanometer features in minutes
  • The optical design allows the use of all Bruker broadband small cantilevers, as well as traditional sized cantilevers.
  • The tip scanning design, 210mm sample stage eliminates sample constraints while retaining the lowest noise and drift performance.

8 minutes with Dimension FastScan AFM.

60 Minutes with Dimension FastScan AFM, 12 Samples,  60 Sites. Automated. Amorphous Drug Formulations. Samples courtesy of M.E. Lauer, O. Grassmann,  F. Hoffmann-La Roche, Basel, Switzerland.

Material Mapping:

FastScan supports Bruker’s patent-pending PeakForce QNM® Imaging Mode, this feature allows the researchers to map and distinguish quantitatively between each  nanomechanical properties while simultaneously imaging sample topography on high resolution

Electrical Characterization:

The Dimension Fast Scan is able to perform electrical characterization at the nanoscale with Bruker-proprietary AFM modes for greater sensitivity, resolution, and dynamic range.

PeakForce TUNA™ and PeakForce SSRM provide electrical characterization capability while simultaneously providing correlated mechanical property information on the same sample location

Nanomanipulation:

Dimension FastScan performs manipulation and lithography at the nanometer and molecular scales. The XYZ closed-loop scanner allows accurate probe positioning with no piezo-creep and extremely low noise. It has the best positioning of any available nanomanipulation system.

Heating and Cooling:

Able to perform temperature control and thermal analysis on samples from –35°C to 250°C while simultaneously scanning in numerous AFM modes. It also able to perform sub-100nm local heating to 400°C using a thermal probe.

 

More information :

bruker.com

bruker.com

 

 

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