D8 Advance X-Ray Diffraction (XRD)


Bruker’s X-ray Diffraction and Scattering portfolio enables detailed analysis of any material from fundamental research to industrial quality control providing forward looking solutions to our customers today.


The D8 ADVANCE is a real quick-change artist that can be configured to take on a single analytical task with great focus and dedicated components, or a fully featured, multi-purpose solution that is capable of dealing with very diverse analytical needs with highest competence.

Bruker’s famous DAVINCI design ensures for all those solutions easy (re)configuration and extensibility to exactly satisfy your analytical needs, now and in the future.

Applications of these qualitative and quantitative techniques include:

  • Phase Identification
  • Quantitative Analysis
  • Crystal structure determination
  • PDF analysis (total scattering)
  • Small Angle X-Ray Scattering (SAXS)
  • X-Ray Reflectometry (XRR)
  • High Resolution X-Ray Diffraction (HRXRD)
  • Reciprocal Space Mapping (RSM)
  • Residual Stress
  • Texture (pole figures)


Dynamic Beam Optimization

Dynamic Beam Optimization (DBO) provides best in class powder diffraction data by setting new benchmarks in terms of counting statistics and peak-to-background ratio, all without the need for manual instrument reconfiguration.

The high-speed energy-dispersive LYNXEYE XE-T detector uniquely combines fast data collection with unprecedented filtering of fluorescence and Kβ radiation. Its proprietary Variable Active Detector Window and the Motorized Anti-Scatter Screen (MASS) enable data collection from lowest 2Th angles without parasitic low-angle background scattering, in particular air scattering.


TRIO – Three in One

The TRIO™ optic is the key component of the D8 ADVANCE Plus, meeting the specific demands on the instrument resolution of the three most commonly used X-ray diffraction geometries in one single optic:

  • Divergent beam for conventional powder diffraction (XRPD)
  • High intensity parallel beam for capillary experiments, height insensitive measurements, surface sensitive grazing incidence geometry (GID), coating thickness determination (XRR) and micro-diffraction (μXRD)
  • Pure Cu-Kα1 parallel beam for high-resolution diffraction (HRXRD) of epitaxial thin films and low symmetry powder samples


DAVINCI Design – uncompromised ease-of-use

The DAVINCI design is the D8 ADVANCE’s landmark as a uniquely modular system. From the X-ray tube, through optics and sample stages all the way to the detectors, any user is capable of changing from one beam geometry to another or exchanging individual components without any tools, offers unparalleled adaptability to any application in X-ray diffraction. The optics changes do not need any realignment. DAVINCI equipped with push-button change of TWIN and TRIO optics, SNAP-LOCK switch to dedicated optics or different wavelengths and real-time component recognition, status display, as well as verification of optics according to user’s measurement method.

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